EPO Patent Grant for Defects Localization Device
Summary
The European Patent Office has granted patent EP4367508B1 for a process and device for the spatially resolved localization of defects in materials. The patent, listing Arumugam, Sri Ranjini as the inventor, is effective March 18, 2026.
What changed
The European Patent Office (EPO) has issued a patent grant, EP4367508B1, for a "PROCESS AND DEVICE FOR THE SPATIALLY RESOLVED LOCALIZATION OF DEFECTS IN MATERIALS." The patent lists Arumugam, Sri Ranjini as the inventor and includes IPC classifications related to materials analysis, artificial intelligence, and computing. The patent is designated for use in multiple European states and is effective March 18, 2026.
This is a patent grant, not a regulatory rule imposing obligations on businesses. It signifies the EPO's recognition of an invention's novelty and inventiveness. Companies operating in materials science, AI, or computing within the designated states should be aware of this patent's existence, particularly if their activities involve similar technologies, to ensure they do not infringe on the patent holder's intellectual property rights.
Source document (simplified)
PROCESS AND DEVICE FOR THE SPATIALLY RESOLVED LOCALIZATION OF DEFECTS IN MATERIALS
Grant EP4367508B1 Kind: B1 Mar 18, 2026
Inventors
Arumugam, Sri Ranjini
IPC Classifications
G01N 23/227 20180101AFI20230113BHEP B82Y 10/00 20110101ALI20230113BHEP G06N 10/00 20220101ALI20230113BHEP
Designated States
AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR
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