← EPO Patent Bulletin

PROCESS AND DEVICE FOR THE SPATIALLY RESOLVED LOCALIZATION OF DEFECTS IN MATERIALS

Grant EP4367508B1 Kind: B1 Mar 18, 2026

Inventors

Arumugam, Sri Ranjini

IPC Classifications

G01N 23/227 20180101AFI20230113BHEP B82Y 10/00 20110101ALI20230113BHEP G06N 10/00 20220101ALI20230113BHEP

Designated States

AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR