Laser Processing System Test Method Patent Grant

ChangeBridge: Patent Grants - Prosthetics (A61F)

Published March 31st, 2026

Detected March 31st, 2026

Summary

USPTO granted Patent US12589034B2 to Carl Zeiss Meditec AG for a method of system testing laser processing systems. The patent covers a functional test of control elements combined with determination of variable parameters affecting laser processing execution, with overlapping test phases. The patent application was filed March 11, 2022, and contains 18 claims.

View original document View source feed page

What changed

Carl Zeiss Meditec AG received granted Patent US12589034B2 for a laser processing system test method invented by Wolf Weimer, Gregor Stobrawa, and Mark Bischoff. The invention describes a method for carrying out a system test of a laser processing system, including executing a functional test of a control element, determining a variable parameter, and determining the influence of that parameter on intended laser processing execution, with the functional test and parameter determination overlapping in time.

This is a routine patent grant with no regulatory compliance requirements. Companies developing or manufacturing laser processing systems for medical applications should review the patent claims to assess potential licensing needs or to ensure their products do not infringe on the granted claims. The patent primarily benefits intellectual property professionals tracking technology developments in laser system testing for medical devices.

Source document (simplified)

← USPTO Patent Grants

Method for carrying out a system test of a laser processing system, control unit and laser processing system

Grant US12589034B2 Kind: B2 Mar 31, 2026

Assignee

Carl Zeiss Meditec AG

Inventors

Wolf Weimer, Gregor Stobrawa, Mark Bischoff

Abstract

A method for carrying out a system test of a laser processing system is disclosed. The method includes the execution of a functional test of a control element of the laser processing system. The method further includes the determination of a variable parameter and the determination of an influence of the determined variable parameter on an intended execution of a laser processing by means of the laser processing system. The execution of the functional test of the control element and the determination of the variable parameter overlap at least partially in time.