USPTO Patent Application: Radiation Dose Optimization for Particle Emitter

ChangeBridge: Patent Apps - Health Informatics (G16H)

Detected March 26th, 2026

Summary

The USPTO has published a new patent application detailing a method for concurrent optimization of radiation doses for particle emitter devices across multiple treatment phases. The application, filed by Roni Hytonen, Perttu Niemelä, and Lauri Halko, aims to improve treatment efficacy by dynamically adjusting radiation doses based on phase-specific objectives.

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What changed

This document is a publication of a United States Patent Application (US20260083983A1) filed on September 26, 2024. The application describes a technical solution for concurrently optimizing radiation doses for particle emitter devices across different operational phases. Key aspects include determining first and second radiation doses for distinct phases, generating phase-specific metrics, calculating a combined dose, and modifying doses to reduce this combined metric before emission.

As this is a patent application, it does not impose direct regulatory obligations or compliance deadlines on regulated entities. However, it represents a novel technological development in the field of radiation therapy and medical devices. Companies involved in the development or manufacturing of particle emitter devices, radiation therapy equipment, or related software may find this patent relevant for understanding potential future technological advancements and competitive landscapes.

Source document (simplified)

← USPTO Patent Applications

CONCURRENT OPTIMIZATION OF PARTICLE EMITTER SYSTEM FOR MULTI-PHASED TREATMENT

Application US20260083983A1 Kind: A1 Mar 26, 2026

Inventors

Roni Hytonen, Perttu Niemelä, Lauri Halko

Abstract

Aspects of this technical solution can determine a first dose of radiation concurrently with a second dose of radiation, the first dose associated with a first phase of operation of a particle emitter device, and the second dose associated with a second phase of operation of a particle emitter device, generate a first phase metric concurrently with a second phase metric, the first phase metric for a first objective on the first dose during the first phase, and the second phase metric for a second objective on the second dose during the second phase, determine, based on the first dose and the second dose, a combined dose over the first phase and the second phase, modify, at least one of the first dose or the second dose to reduce the combined metric, and cause the particle emitter device to emit the first dose and the second dose.