NEVIRA
Intent to Use
TM99668520
Kind: intent_to_use
Mar 25, 2026
Abstract
Metrology apparatus for measurement of semiconductor wafers; Metrology apparatus for integration with other process equipment for the measurement of semiconductor wafers; Optical metrology apparatus for measurement of semiconductor wafers; Optical metrology apparatus for integration with other process equipment for the measurement of semiconductor wafers; Measuring apparatus for measuring semiconductor wafers; Weighing apparatus and instruments
Filing Date
2026-02-24