System for learning new visual inspection tasks using a few-shot meta-learning method
Assignee
HITACHI, LTD.
Inventors
Lasitha Sandaruwan Vidyaratne, Xian Yeow Lee, Mahbubul Alam, Ahmed Farahat, Dipanjan Ghosh, Maria Teresa Gonzalez Diaz, Chetan Gupta
Abstract
Systems and methods described herein which can involve for a first input of a plurality of labeled images of a new domain task, processing the first plurality of labeled images through a plurality of backbone snapshots, each of the backbone snapshots representative of a model trained across a plurality of other domain tasks, each of the plurality of backbone snapshots configured to output a first plurality of features responsive to the input; processing a second input of second plurality of unlabeled images through the plurality of backbone snapshots to output a second plurality of features responsive to the second input; and generating a representative model for the new domain task from the clustering and transformation of the first plurality of features and as associated from the clustered and transformed second plurality of features.
CPC Classifications
Filing Date
2023-06-15
Application No.
18210221
Claims
13