Probe-securing apparatus

Abstract

Techniques associated with an apparatus that is configured to support probes during data collection. An example apparatus may include a base. The example apparatus may also include a mechanism coupled to the base. The mechanism may include means for detachably coupling a probe to the mechanism. In some examples, the mechanism may be configured to apply an amount of force associated with obtaining a measurement from the probe. In some examples, the apparatus may include multiple mechanisms for supporting multiple probes during data collection. These multiple probes may be able to generate data associated with different portions of a material being scanned.

CPC Classifications