Methods and apparatus for analyzing pathology patterns of whole-slide images based on graph deep learning
Assignee
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
Inventors
Sunghoon Kwon, Yongju Lee, Kyoungseob Shin, Kyung Chul Moon, Jeong Hwan Park, Sohee Oh
Abstract
The present invention relates to a method and apparatus for analyzing pathology patterns of whole-slide images based on graph deep learning, which may include: a whole-slide image (WSI) compression step of compressing WSI into a superpatch graph; a graph neural networks (GNN) analysis step of embedding node features and context features into the superpatch graph through a GNN model and calculating contributions for each node and edge; a biomarker acquisition step of classifying and grouping the superpatch graph according to the contributions for each node, connecting the classified and grouped superpatch graph in units of groups to generate connected graphs, normalizing and clustering features of the connected graphs, and acquiring environmental graph biomarkers for each group; and a diagnostic information extraction step of extracting and providing diagnostic information on the WSI based on the environmental graph biomarker for each group.
CPC Classifications
Filing Date
2023-03-07
Application No.
18179846
Claims
9