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Methods of predicting reliability information of storage devices and methods of operating storage devices

Grant US12586004B2 Kind: B2 Mar 24, 2026

Assignee

Samsung Electronics Co., Ltd.

Inventors

Chanha Kim, Youngeun Kim, Kangho Roh, Younghoon Jung, Mijung Cho

Abstract

In a method of operating a storage device including a plurality of nonvolatile memories, reliability information of the storage device is predicted. A read operation on the storage device is performed based on a result of predicting the reliability information. In the predicting the reliability information of the storage device, a model request signal is outputted by selecting one of a plurality of machine learning models as an optimal machine learning model based on deterioration characteristic information and deterioration phase information. The model request signal corresponds to the optimal machine learning model. The plurality of machine learning models are used to generate first reliability information related to the plurality of nonvolatile memories. First parameters of the optimal machine learning model may be received based on the model request signal. The first reliability information is generated based on the deterioration characteristic information and the first parameters.

CPC Classifications

G06N 20/20 G11C 16/26

Filing Date

2021-10-08

Application No.

17497076

Claims

20