Framework for selecting thresholds for anomaly detection models and generating quantitative explanations
Assignee
Dell Products L.P.
Inventors
Adriana Bechara Prado, Alexander Eulalio Robles Robles, Eduarda Tatiane Caetano Chagas, Helen Cristina de Mattos Senefonte, Jonathan Mendes De Almeida, Karen Stéfany Martins
Abstract
A framework for extracting quantitative and comparable explanations in terms of feature-value ranges for anomaly detection models based on outlier scores is disclosed. In a first phase, outlier scores are computed for a data set. In a second phase, thresholds per feature, which are used to identify abnormal entries or records in the data set, are extracted. In a third phase, a map between feature-outlier scores and feature-value ranges is generated. The feature-value ranges represent explanations. The explanations may include extracting quantitative metrics to explain a model.
CPC Classifications
Filing Date
2023-10-25
Application No.
18494523
Claims
20