GENERATION OF SYNTHETIC IMAGES FOR TRAINING OF DEFECT DETECTION MODELS
Assignee
Intel Corporation
Inventors
Jiaxiang Jiang, Mahesh Subedar, Jennifer Marie Williams, Amrutha Machireddy
Abstract
Systems, apparatus, articles of manufacture, and methods to generate synthetic images for training of defect detection models are disclosed. An example system disclosed herein produces synthetic images of pallet defects to train object detection models. In some examples, a small set of real images containing defects, associated masks and textual descriptions is used to fine tune a latent diffusion model. The fine-tuned model accepts a masked input image, a mask that defines the region to be altered, and a defect description, and generates a synthetic image with the defect inpainted into the masked region. In some examples, generated synthetic images are filtered to remove outliers that do not match the real defect distribution. The filtered synthetic dataset, together with a limited set of real images, is then used to train a downstream object detection model capable of identifying pallet damage in captured images.
CPC Classifications
Filing Date
2025-11-24
Application No.
19399089