SYSTEMS AND METHODS FOR FABRICATING SUPERCONDUCTING INTEGRATED CIRCUITS
Applicants
D-Wave Systems Inc.
Inventors
HARRIS, Richard G., RICH, Christopher B.
Abstract
A system and method for mitigating flux trapping in a superconducting integrated circuit. A first metal layer is formed having a first critical temperature and a first device, and a flux directing layer is formed having a second critical temperature. The flux directing layer is positioned in communication with an aperture location, and the aperture location is spaced from the first device to isolate the first device from flux trapped in the aperture. The superconducting integrated circuit is cooled from a first temperature that is above both the first and second critical temperatures to a second temperature that is less than both the first and second critical temperatures by a cryogenic refrigerator. A relative temperature difference between the first and second critical temperatures causes the flux directing layer to direct flux away from the first device and trap flux at the aperture location.
IPC Classifications
Designated States
AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR