SYSTEM AND METHOD FOR EYE EXAMINATION
Publication
EP4709257A1
Kind: A1
Mar 18, 2026
Applicants
SlitLED Ltd
Inventors
NARODIZKY, Michael, HALEVY, Benjamin, YONA, Zvi, GAMLIEL, Avihu Meir
IPC Classifications
A61B 3/14 20060101AFI20250110BHEP
Designated States
AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, ME, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR