BATTERY MANAGEMENT MODULE AND METHOD FOR DETECTING DEFECTIVE NAND GATE CIRCUIT IN BATTERY MANAGEMENT MODULE
Publication
EP4549976A1
Kind: A1
Mar 18, 2026
Applicants
SAMSUNG SDI CO., LTD.
Inventors
BAE, Jin Cheol
IPC Classifications
G01R 31/396 20190101AFI20260130BHEP
G01R 31/36 20200101ALI20260130BHEP
H01M 10/48 20060101ALI20260130BHEP
B60L 3/00 20190101ALI20260130BHEP
G01R 31/26 20200101ALI20260130BHEP
G08B 21/18 20060101ALI20260130BHEP
G01R 31/28 20060101ALI20260130BHEP
G05B 23/02 20060101ALI20260130BHEP
H01M 10/42 20060101ALI20260130BHEP
H02J 7/00 20060101ALI20260130BHEP
H02J 7/50 20260101ALI20260130BHEP
H02J 7/60 20260101ALI20260130BHEP
Designated States
AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, ME, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR