← EPO Patent Bulletin

PROCESS ANALYSIS DEVICE, PROCESS ANALYSIS METHOD, AND PROCESS ANALYSIS PROGRAM

Publication EP4250029A1 Kind: A1 Mar 18, 2026

Applicants

OMRON Corporation

Inventors

HATTORI, Reiko, OTA, Yuya, SHIBAGAKI, Saeko, MINEMOTO, Toshifumi

IPC Classifications

G05B 19/418 20060101AFI20241112BHEP G06N 7/00 20230101ALI20241112BHEP G05B 19/4063 20060101ALI20241112BHEP G05B 23/02 20060101ALI20241112BHEP G06N 20/10 20190101ALI20241112BHEP G06N 7/01 20230101ALI20241112BHEP

Designated States

AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR